High temperature pulsed-gate robustness testing of SiC power MOSFETs

نویسندگان

  • Asad Fayyaz
  • Alberto Castellazzi
چکیده

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عنوان ژورنال:
  • Microelectronics Reliability

دوره 55  شماره 

صفحات  -

تاریخ انتشار 2015